Regression imputation is commonly used to compensate for item nonresponse when auxiliary data are available. It is common practice to compute survey estimators by treating imputed values as observed ...

Pinpointing the root cause of low yield in chip manufacturing.

This paper proposes a new statistic to test independence between two high dimensional random vectors X: p₁ × 1 and Y: p₂ × 1. The proposed statistic is based on the sum of regularized sample canonical ...