EDN

Probe card is designed for wafer-level packages

Yamaichi Electronics offer new products for the wafer-level test of VLSI semiconductors. The new development YVERTICAL® is a vertical probe card with miniaturised spring probe contacts designed for ...
Nasdaq

FormFactor Introduces Automated Cryogenic Wafer Probe System to Enable Superconducting Compute Applications

LIVERMORE, Calif., June 24, 2021 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, collaborating with Northrop Grumman Corporation , a ...

This quantum computing stock has a secret weapon nobody on Wall Street has priced in

FormFactor is powering parts of the quantum computing build-out with essential cryogenic testing infrastructure, while ...
Nasdaq

FormFactor and Focus Microwaves Introduce Integrated, Automated Probe Solution for Wafer-level Characterization of 5G Devices and Circuits

LIVERMORE, Calif., Oct. 02, 2019 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading electrical test and measurement supplier to the semiconductor industry ...
Semiconductor Engineering

Wafer-Level Test Infrastructure for Higher Parallel Wafer Level Testing of SoC

A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...
Business Wire

Technoprobe to Showcase Latest Technology for Wafer Level Test at SWTest 2021 Conference in San Diego August 30 – September 1

CERNUSCO LOMBARDONE, Italy--(BUSINESS WIRE)--Technoprobe SpA, a global leader in the microelectronics and semiconductor test industry, will showcase multiple leading-edge technologies during the 30 th ...
EDN

Small, high-performance ICs require wafer-level-RF measurements

Continuing increases in the speed of semiconductor devices combined with higher levels of integration, on-chip wireless functions, and the usage of mixed-signal-device designs are driving new ...
Semiconductor Engineering

Improving Wafer-Level S-Parameters Measurement Accuracy And Stability With Probe-Tip Power Calibration Up To 110 GHz For 5G Applications

Demands for mission critical wireless services such as autonomous driving and telehealth require higher data transfer rates and lower latencies. Such applications are now driving the use of radio ...
Hackaday

Hair Today Gone Tomorrow: Four Men Go To Fix A Wafer Prober

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...
EurekAlert!

Wafer-level manufactured meta-aspheric lens enables ultracompact wide-FOV near-infrared imaging

Figure 1 | Schematic and demonstration of the meta-aspheric lens. a, Illustration of the MAL computational imaging system, comprising a hybrid optical module and a computational processing module. b, ...
AZOM

Experience Unmatched AFM Precision with the Park FX200

This article introduces the FX200, the latest large-sample Atomic Force Microscope (AFM) from Park Systems, developed to meet both fundamental and advanced research requirements. The FX200 is ...