Abstract: Wafer mappings (WM) help diagnose low-yield issues in semiconductor production by offering vital information about process anomalies. As integrated circuits continue to grow in complexity, ...
[Mike Stewart] powers up a thrust meter from an Apollo lunar module. This bit of kit passed inspection on September 25, 1969. Fortunately [Mike] was able to dig up some old documentation which ...
Abstract: Images of permanently shadowed regions (PSRs) acquired from lunar orbit are challenging to model and interpret because of the diffuse secondary illumination. In this work, we propose, ...
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