The dual-method gauge supports traceable inspection at 250 mm/s and comparative measurement at speeds up to 500 mm/s.
The platform measures individual emitters and integrates with UltraFLEXplus for combined optical and electrical testing.
The facility will support quantum research for EPB, UTC and Vanderbilt, including power grid optimization and workforce development.
The partnership integrates optical switching hardware, software and APIs to support dynamic connectivity across GPU and HPC workloads.
The portfolio addresses rising uplink capacity needs driven by cloud-based AI, augmented reality and generative AI ...
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